Unmatched resolution and absolute accuracy is now possible due to the new development of the Linseis Laser Dilatometer of the Pico-series. As the name indicates already the resolution goes up to Picometers (0,3nm = 300 Picometer). That means resolutions can be obtained which are up to a factor 33,33 higher as the resolution that were possible up to date. On top the principle of interference measurement give the possibility for much higher accuracy's, especially as some special computer calibrations are used. Up to now absolute accuracy's of 1% were normal, with best accuracy's up to 100nm. The new method allows accuracy's up to 30nm.

Linseis L75/LASER only needs slight machining of the sample. All you need to do is just prepare one sample, as with the conventional push rod type dilatometer. The system does not require any specific sample geometry. All types of material, reflecting or none reflecting can be evaluated with the system. The measurement principle is an "absolute measurement", not like conventional double sample pushrod Dilatometers, providing much higher precision. No calibration has to be undertake, unlike with conventional Dilatometers.

Features

• Michelson Principle Laser Dilatometer
• Non contact expansion and shrinkage measurement
• no calibration needed
• Any solid sample material (reflecting & not reflecting)
• Free choice of sample geometry
• Sample preparation same as with conventional Dilatometer
• Measurements under inert, oxid., red., vacuum
• Maximum precision 0,3 Nanometer
• temperature range -180 up to 1600°C*
• Induction and heat resistance furnace possible